| Title | Universal quantum gate fidelity exceeding the fault-tolerance threshold in silicon |
|---|---|
| Authors | Akito Noiri¹, Kenta Takeda¹, Takashi Nakajima², Takashi Kobayashi², Amir Sammak³, Giordano Scappucci⁴, and Seigo Tarucha¹,² -- 1 Center for Emergent Matter Science (CEMS), RIKEN, Wako, Saitama, Japan. 2 Center for Quantum Computing (RQC), RIKEN, Wako, Saitama, Japan 3 QuTech and Netherlands Organization for Applied Scientific Research (TNO), Delft, Netherlands 4 QuTech and Kavli Institute of Nanoscience, Delft University of Technology, Delft, Netherlands |
| Date | Oct,25ᵗʰ-31ˢᵗ 2021 |
